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On the Production Testing of Memristor Ratioed Logic (MRL) Gates
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Ahmed Shukry Emara, Ahmed Hassan Madian, Hassanein Hamed Amer, Sherif Hassanein Amer, Mohamed Bakr Abdelhalim
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in Circuits and Systems by Scientific Research Publishing, Inc,.
2016 Volume 07, Issue 10, p3016-3025
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SHERPA/RoMEO (journal policies)
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Semantic Scholar
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