[b0]
via fuzzy
|
Design and test rules for CMOS circuits to facilitate IDDQ testing of bridging faults
K.-J. Lee, M.A. Breuer
1992
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
doi:10.1109/43.127626
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|
[b1]
via fuzzy
|
QUIETEST: a quiescent current testing methodology for detecting leakage faults
W. Mao, R.K. Gulati, D.K. Goel, M.D. Ciletti
International Conference on Computer Aided Design
doi:10.1109/iccad.1990.129902
dblp:conf/iccad/MaoGGC90
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[b2]
via fuzzy
|
Enhancement of resolution in supply current based testing for large ICs
Y.K. Malaiya, A.P. Jayasumana, Qiao Tong, S.M. Menon
IEEE VLSI Test Symposium
doi:10.1109/vtest.1991.208173
dblp:conf/vts/MalaiyaJTM91
|
web.archive.org [PDF]
|
[b3]
via fuzzy
|
Reliability benefits of I DDQ
Steven D. McEuen
1992
Journal of electronic testing
doi:10.1007/bf00135336
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|
[b4]
via grobid
|
Michael J. Riezenman, "Test and Measurement," IEEE Spectrum, Jan. 1995, pp. 52-55.
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|
[b5]
via fuzzy
|
Built-in current testing
W. Maly, M. Patyra
1992
IEEE Journal of Solid-State Circuits
doi:10.1109/4.121566
|
|
[b6]
via fuzzy
|
Design of ICs applying built-in current testing
Wojciech Maly, Marek Patyra
1992
Journal of electronic testing
doi:10.1007/bf00135343
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|
[b7]
via fuzzy
|
A comparative study of fuzzy versus "fixed" thresholds for robust queue management in cell-switching networks
A.R. Bonde, S. Ghosh
1994
IEEE/ACM Transactions on Networking
doi:10.1109/90.330414
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|
[b8]
via grobid
|
F. R. Biglari and X. D. Fang, "Real-Time Fuzzy Logic Control for Maximizing the Tool Life of Small-Diameter Drills," Fuzzy Sets and Systems, 72, 1995, pp. 91-101.
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[b9]
via grobid
|
R. R. Yanger and D. P. Filev, Essentials of Fuzzy Modeling and Control, John Wiley & Sons, 1994.
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