Fuzzy-based circuit partitioning in built-in current testing release_sncc5k3ibnhudj6icqjibpboyy

by Wang-Dauh Tseng, Kuochen Wang


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Showing 1 - 10 of 10 references (in 142ms)

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Design and test rules for CMOS circuits to facilitate IDDQ testing of bridging faults
K.-J. Lee, M.A. Breuer
1992   IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

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QUIETEST: a quiescent current testing methodology for detecting leakage faults
W. Mao, R.K. Gulati, D.K. Goel, M.D. Ciletti
International Conference on Computer Aided Design
doi:10.1109/iccad.1990.129902  dblp:conf/iccad/MaoGGC90 

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Enhancement of resolution in supply current based testing for large ICs
Y.K. Malaiya, A.P. Jayasumana, Qiao Tong, S.M. Menon
IEEE VLSI Test Symposium
doi:10.1109/vtest.1991.208173  dblp:conf/vts/MalaiyaJTM91 
web.archive.org [PDF]

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Reliability benefits of I DDQ
Steven D. McEuen
1992   Journal of electronic testing

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Michael J. Riezenman, "Test and Measurement," IEEE Spectrum, Jan. 1995, pp. 52-55.

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Built-in current testing
W. Maly, M. Patyra
1992   IEEE Journal of Solid-State Circuits

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Design of ICs applying built-in current testing
Wojciech Maly, Marek Patyra
1992   Journal of electronic testing

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A comparative study of fuzzy versus "fixed" thresholds for robust queue management in cell-switching networks
A.R. Bonde, S. Ghosh
1994   IEEE/ACM Transactions on Networking

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F. R. Biglari and X. D. Fang, "Real-Time Fuzzy Logic Control for Maximizing the Tool Life of Small-Diameter Drills," Fuzzy Sets and Systems, 72, 1995, pp. 91-101.

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R. R. Yanger and D. P. Filev, Essentials of Fuzzy Modeling and Control, John Wiley & Sons, 1994.