Fuzzy-based circuit partitioning in built-in current testing

by Wang-Dauh Tseng, Kuochen Wang

p397-400

Type paper-conference
Stage

published

DOI 10.1109/aspdac.1997.600267
dblp conf/aspdac/TsengW97

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Fuzzy-based circuit partitioning in built-in current testing release_rev_a4bde677-1024-4b3c-b235-0b0966a725c8