Context-Sensitive Modeling and Analysis of Cyber-Physical Manufacturing Systems for Anomaly Detection and Diagnosis release_rev_78a43897-2822-434f-bb42-c720f1088c56

by Miguel A. Saez, Francisco P. Maturana, Kira Barton, Dawn M. Tilbury

Published in IEEE Transactions on Automation Science and Engineering by Institute of Electrical and Electronics Engineers (IEEE).

2019   p1-12

Type  article-journal
Stage   published
Year   2019
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ISSN-L:  1545-5955
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