Easily testable and fault-tolerant FFT butterfly networks release_qzthjpm2bnes7ktkmmtfy5dlda

by Jin-Fu Li, Shyue-Kung Lu, Shih-Arn Hwang, Cheng-Wen Wu

Published in IEEE transactions on circuits and systems - 2, Analog and digital signal processing by Institute of Electrical and Electronics Engineers (IEEE).

2000   Volume 47, p919-929

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