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Time-multiplexed test access architecture for stacked integrated circuits
release_qpemtjbnungodb7noz5vsgd6xq
by
Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park
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in IEICE Electronics Express by Institute of Electronics, Information and Communications Engineers (IEICE).
2016 Volume 13, Issue 14, p20160314-20160314
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