Time-multiplexed test access architecture for stacked integrated circuits release_qpemtjbnungodb7noz5vsgd6xq

by Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park

Published in IEICE Electronics Express by Institute of Electronics, Information and Communications Engineers (IEICE).

2016   Volume 13, Issue 14, p20160314-20160314

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