Cracking the 500-language problem release_qk3u4ui2t5c4hormsk2rz7fune

by R. Lammel, C. Verhoef

Published in IEEE Software by Institute of Electrical and Electronics Engineers (IEEE).

2001   Volume 18, p78-88

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Type  article-journal
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Year   2001
DOI  10.1109/52.965809
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