Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices release_p5edthdvyvbsbng2fu7gkiyc5q

by Yao Wang, Sorin D. Cotofana, Liang Fang

Published in IEEE/ACM International Symposium on Nanoscale Architectures by ACM Press.

2012   p109-115

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