Fault Tolerance and Scaling in e-Science Cloud Applications: Observations from the Continuing Development of MODISAzure release_ox54yfpyy5e5rpz3lcgsuz6t5a

by Jie Li, Marty Humphrey, You-Wei Cheah, Youngryel Ryu, Deb Agarwal, Keith Jackson, Catharine van Ingen

Published in IEEE International Conference on e-Science by IEEE.

2010   p246-253

Archived Files and Locations

application/pdf  980.9 kB
file_76noip3lp5daxctwda54usfsbu
web.archive.org (webarchive)
digital.library.unt.edu (web)
Read Archived PDF
Archived
Type  paper-conference
Stage   published
Year   2010
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
Catalog Record
Revision: 9f65ff37-70fa-4659-b8e2-4d45506a4d57
API URL: JSON