To, Liu, Olson, Belytschko, Chen, Shephard, Chung, Ghanem, Voorhees, Seidman, Wolverton, Chen, Moran, Freeman, Tian, Luo, Lautenschlager, Challoner, 2008. Materials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system 42.. https://doi.org/10.1007/s00466-008-0267-1