The impact of trapping centers on AlGaN/GaN resonant tunneling diode release_jqtx6s45kbalvfibaqmvratdfe

by Haoran Chen, Lin'an Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao

Published in IEICE Electronics Express by Institute of Electronics, Information and Communications Engineers (IEICE)
ISSN-L 1349-2543
Volume 10
Issue 19
Page(s) 20130588-20130588
Release Year 2013
Publisher Institute of Electronics, Information and Communications Engineers (IEICE)
Primary Language en (lookup)

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Stage   published
Year   2013
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ISSN-L:  1349-2543
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