| ISSN-L | 1349-2543 |
| Volume | 10 |
| Issue | 19 |
| Page(s) | 20130588-20130588 |
| Release Year | 2013 |
| Publisher | Institute of Electronics, Information and Communications Engineers (IEICE) |
| Primary Language | en
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The impact of trapping centers on AlGaN/GaN resonant tunneling diode
release_jqtx6s45kbalvfibaqmvratdfe
by
Haoran Chen, Lin'an Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao
Published
in IEICE Electronics Express
by Institute of Electronics, Information and Communications Engineers (IEICE)
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