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Functionally testable path delay faults on a microprocessor
release_jfvko2p7hzal3lazsaaacyeofa
by
Wei-Cheng Lai, A. Krstic, Kwang-Ting Cheng
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in IEEE Design & Test of Computers by Institute of Electrical and Electronics Engineers (IEEE).
2000 Volume 17, p6-14
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