Fast Aberration Measurement in Multi-Dimensional STEM release_gpmgmo3zlvccvdst5e47wfqu3i

by Andrew R. Lupini, Miaofang Chi, Sergei V. Kalinin, Albina Y. Borisevich, Juan Carlos Idrobo, Stephen Jesse

Published in Microscopy and Microanalysis by Cambridge University Press (CUP).

2016   Volume 22, Issue S3, p252-253

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