BibTeX
CSL-JSON
MLA
Harvard
Fast Aberration Measurement in Multi-Dimensional STEM
release_gpmgmo3zlvccvdst5e47wfqu3i
by
Andrew R. Lupini, Miaofang Chi, Sergei V. Kalinin, Albina Y. Borisevich, Juan Carlos Idrobo, Stephen Jesse
Published
in Microscopy and Microanalysis by Cambridge University Press (CUP).
2016 Volume 22, Issue S3, p252-253
Archived Files and Locations
application/pdf 302.6 kB
file_swn4igkkkbcrxdrv4bk4s2azhy
|
web.archive.org (webarchive) www.cambridge.org (web) |
Read Archived PDF
Preserved and Accessible
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
access all versions, variants, and formats of this works (eg, pre-prints)
Cite This
Lookup Links
oaDOI/unpaywall (OA fulltext)
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar