Design and test rules for CMOS circuits to facilitate IDDQ testing of bridging faults

by K.-J. Lee, M.A. Breuer

Published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems by Institute of Electrical and Electronics Engineers (IEEE).

1992 Volume 11, p659-670

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Type article-journal
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published

Year 1992

DOI 10.1109/43.127626

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ISSN-L: 0278-0070

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