Design and test rules for CMOS circuits to facilitate IDDQ testing of bridging faults release_gkzvptasdnhndevrd5zaj2c65m

by K.-J. Lee, M.A. Breuer

Published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems by Institute of Electrical and Electronics Engineers (IEEE).

1992   Volume 11, p659-670

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Type  article-journal
Stage   published
Year   1992
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