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Using a SMT Solver for Risk Analysis: Detecting Logical Mistakes in Texts
release_g7axzejizzg7bnxiujfrqcz26a
by
F. Bannay, M.C. Lagasquie-Schiex, W. Raynaut, P. Saint-Dizier
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in IEEE International Conference on Tools with Artificial Intelligence by IEEE.
2014 p867-874
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