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Optimal centering, tolerancing, and yield determination via updated approximations and cuts
release_elcthgwb5zgvxe7t3bqinwwfky
by
J. Bandler, H. Abdel-Malek
Published
in IEEE Transactions on Circuits and Systems by Institute of Electrical and Electronics Engineers (IEEE).
1978 Volume 25, Issue 10, p853-871
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