Optimal centering, tolerancing, and yield determination via updated approximations and cuts release_elcthgwb5zgvxe7t3bqinwwfky

by J. Bandler, H. Abdel-Malek

Published in IEEE Transactions on Circuits and Systems by Institute of Electrical and Electronics Engineers (IEEE).

1978   Volume 25, Issue 10, p853-871

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Year   1978
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