A simple and reliable wafer-level electrical probing technique for III-nitride light-emitting epitaxial structures release_d3uo2qgvhjf2lgri53hbybhtiu

by Y.S. Zhao, C.L. Jensen, R.W. Chuang, H.P. Lee, Z.J. Dong, R. Shih

Published in IEEE Electron Device Letters by Institute of Electrical and Electronics Engineers (IEEE).

2000   Volume 21, p212-214

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