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A simple and reliable wafer-level electrical probing technique for III-nitride light-emitting epitaxial structures
release_d3uo2qgvhjf2lgri53hbybhtiu
by
Y.S. Zhao, C.L. Jensen, R.W. Chuang, H.P. Lee, Z.J. Dong, R. Shih
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in IEEE Electron Device Letters by Institute of Electrical and Electronics Engineers (IEEE).
2000 Volume 21, p212-214
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