A survey of cross-layer power-reliability tradeoffs in multi and many core systems-on-chip release_bl2v6dfvxnfxnble4pkcg2pcw4

by Ahmed A. Eltawil, Michael Engel, Bibiche Geuskens, Amin Khajeh Djahromi, Fadi J. Kurdahi, Peter Marwedel, Smail Niar, Mazen A.R. Saghir

Published in Microprocessors and microsystems by Elsevier BV.

2013   Volume 37, p760-771

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