Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems release_ap7a7bmooja6dllwjzlotsq2mq

by Susanne Kandl

Released as a paper-conference by IEEE.

2006  

Archived Files and Locations

application/pdf  179.0 kB
file_bvpdic52mrgafbduftx3gybmra
web.archive.org (webarchive)
web.archive.org (webarchive)
homepages.herts.ac.uk (web)
core.ac.uk (web)
Read Archived PDF
Preserved and Accessible
Type  paper-conference
Stage   unknown
Year   2006
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
Catalog Record
Revision: 5db942b7-b4e3-4f52-ab19-700431f91604
API URL: JSON