@inproceedings{gonzalez_etoz_alatise_2020, 
  title={Gate stresses and threshold voltage instability in normally-OFF GaN HEMTs}, 
  DOI={10.23919/epe20ecceeurope43536.2020.9215865}, 
  publisher={IEEE}, 
  author={Gonzalez, Jose Ortiz and Etoz, Burhan and Alatise, Olayiwola}, 
  year={2020}
  }