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AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer
release_52x3q4ugxzfzdc3grnrru65ege
by
Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao, Xiangning He, Nicholas Wright
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in IEEE transactions on industrial electronics (1982. Print) by Institute of Electrical and Electronics Engineers (IEEE).
2019 Volume 66, Issue 10, p8197-8204
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