AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer release_52x3q4ugxzfzdc3grnrru65ege

by Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao, Xiangning He, Nicholas Wright

Published in IEEE transactions on industrial electronics (1982. Print) by Institute of Electrical and Electronics Engineers (IEEE).

2019   Volume 66, Issue 10, p8197-8204

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