Efficient Test Solutions for Core-Based Designs release_3qvtygpxrjf7tpu3j64enumjly

by E. Larsson, K. Arvidsson, H. Fujiwara, Z. Peng

Published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems by Institute of Electrical and Electronics Engineers (IEEE).

2004   Volume 23, p758-775

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