Peak extraction in fluorophore-aided scattering microscopy release_3rj7xqensrhilhde2e5opvcqmq [as of editgroup_gblbkvt5ozb5hg5iqnn2b7s4sq]

by Chenguang Liu, Jian Liu, Jiubin Tan

Published in Surface Topography Metrology and Properties by IOP Publishing.

2019  

Type  article-journal
Stage   published
Date   2019-09-11
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ISSN-L:  2051-672X
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