IEEE International Reliability Physics Symposium container_xehdwkftajdbzifqiwoujltqje

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Real-time observation of trap generation by scanning tunneling microscopy and the correlation to high-κ gate stack breakdown

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Y. C. Ong, D. S. Ang, K. L. Pey, S. J. O'Shea, K. Kakushima, T. Kawanago, H. Iwai, C. H. Tung
2009 | IEEE International Reliability Physics Symposium unpublished
doi:10.1109/irps.2009.5173334  

A two-stage model for negative bias temperature instability

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T. Grasser, B. Kaczer, W. Goes, Th. Aichinger, Ph. Hehenberger, M. Nelhiebel
2009 | IEEE International Reliability Physics Symposium unpublished
doi:10.1109/irps.2009.5173221  

New on-chip screening of gate oxides smart power devices for automotive applications

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Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner
2009 | IEEE International Reliability Physics Symposium unpublished
doi:10.1109/irps.2009.5173313  
71
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2 preserved and accessble (bright)
69 preserved, inaccessible (dark)
0 no known preservation
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paper-conference 71
ISSN-L?  1541-7026
Print:  1541-7026
Electronic:  1938-1891
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scholarsportal: years 2009-2020
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