wikidata.org
Asian Test Symposium
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Homepage URLs
http://www.wikicfp.com/cfp/program?id=254 |
Example Publications
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories
Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang
2013
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Asian Test Symposium
doi:10.1109/ats.2013.62 dblp:conf/ats/KangLCK13
High Quality Testing of Grid Style Power Gating
Vasileios Tenentes, Saqib Khursheed, Bashir M. Al-Hashimi, Shida Zhong, Sheng Yang
2014
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Asian Test Symposium
doi:10.1109/ats.2014.37 dblp:conf/ats/TenentesKAZY14
A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST
Takaaki Kato, Senling Wang, Yasuo Sato, Seiji Kajihara, Xiaoqing Wen
2016
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Asian Test Symposium
doi:10.1109/ats.2016.59 dblp:conf/ats/KatoWSKW16
The Test Ability of an Adaptive Pulse Wave for ADC Testing
Xiaoqin Sheng, Hans G. Kerkhoff
2010
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Asian Test Symposium
doi:10.1109/ats.2010.56 dblp:conf/ats/ShengK10
Variation-Aware Fault Grading
A. Czutro, M.E. Imhof, J. Jiang, A. Mumtaz, M. Sauer, B. Becker, I. Polian, H.-J. Wunderlich
2012
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Asian Test Symposium
doi:10.1109/ats.2012.14 dblp:conf/ats/CzutroIJMSBPW12