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Proceedings of the Asian Test Symposium
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IEEE, Inc
Homepage URLs
http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000754 |
Example Publications
Test/Repair Area Overhead Reduction for Small Embedded SRAMs
Baosheng Wang, Qiang Xu
2006
|
Proceedings of the Asian Test Symposium
unpublished
doi:10.1109/ats.2006.260990
Bluetooth Hopping BER Testing Methodologies on a Production Test Platform
David Bement, David Karr
2007
|
Proceedings of the Asian Test Symposium
unpublished
doi:10.1109/ats.2007.4388067
Test Education in the Global Economy
Jacob Abraham, Salvador Mir, Yinghua Min, Jeremy Wang, Cheng-Wen Wu
2007
|
Proceedings of the Asian Test Symposium
unpublished
doi:10.1109/ats.2007.4387982
An Observability Branch Coverage Metric Based on Dynamic Factored Use-Define Chains
Tao Lv, Ling-yi Liu, Yang Zhao, Hua-wei Li, Xiao-wei Li
2006
|
Proceedings of the Asian Test Symposium
unpublished
doi:10.1109/ats.2006.260998
Simulating Open-Via Defects
Stefan Spinner, Jie Jiang, Ilia Polian, Piet Engelke, Bernd Becker
2007
|
Proceedings of the Asian Test Symposium
unpublished
doi:10.1109/ats.2007.4388023