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Journal of electronic testing container_dt5ooavfurcrfbcz432scm5wcu

Springer-Verlag

Homepage URLs

http://www.springer.com/sgw/cda/frontpage/0,11855,5-40109-70-35691461-0,00.html
https://link.springer.com/journal/10836
https://link.springer.com/journal/volumesAndIssues/10836

Example Publications

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Balen
2021 | Journal of electronic testing
doi:10.1007/s10836-021-05949-x  

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality

Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen
2021 | Journal of electronic testing
doi:10.1007/s10836-021-05943-3  
1,820
Known Releases
Preservation Summary [more]
311 preserved and accessble (bright)
1,509 preserved, inaccessible (dark)
0 no known preservation
Release Types
article-journal 1,820
Publication Type  journal
Country Code  us
ISSN-L?  0923-8174
    Print:  0923-8174
    Electronic:  1573-0727
Wikidata  Q15760574
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