wikidata.org
IEEE VLSI Test Symposium
container_biljrku4ijdexbgr7opunzp32e
Homepage URLs
http://www.tttc-vts.org/ |
Example Publications
Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller
Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
2009
|
IEEE VLSI Test Symposium
doi:10.1109/vts.2009.32 dblp:conf/vts/ManiatakosKTJM09
Panel 12C: Apprentice – VTS edition judging session
Kee Sup Kim
2010
|
IEEE VLSI Test Symposium
doi:10.1109/vts.2010.5469531 dblp:conf/vts/Kim10a
Comprehensive online defect diagnosis in on-chip networks
Amirali Ghofrani, Ritesh Parikh, Saeed Shamshiri, Andrew DeOrio, Kwang-Ting Cheng, Valeria Bertacco
2012
|
IEEE VLSI Test Symposium
doi:10.1109/vts.2012.6231078 dblp:conf/vts/GhofraniPSDCB12
Net diagnosis using stuck-at and transition fault models
Lixing Zhao, Vishwani D. Agrawal
2012
|
IEEE VLSI Test Symposium
doi:10.1109/vts.2012.6231106 dblp:conf/vts/ZhaoA12
Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients
Suraj Sindia, Vishwani D. Agrawal, Virendra Singh
2011
|
IEEE VLSI Test Symposium
doi:10.1109/vts.2011.5783756 dblp:conf/vts/SindiaAS11