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IEEE design & test
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Institute of Electrical and Electronics Engineers
Homepage URLs
http://ieeexplore.ieee.org/servlet/opac?punumber=6221038 |
https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221038 |
Example Publications
ISLPED 2020: An Experience of Virtual Conference during COVID-19 Time
Qinru Qiu, David Atienza Alonso
2020
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IEEE design & test
doi:10.1109/mdat.2020.3021993 pmcid:PMC8905604
Autonomous Systems and the Challenges in Verification, Validation, and Test
David Yeh
2018
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IEEE design & test
doi:10.1109/mdat.2018.2816940
Dispelling the Myths of Parallel Computing
Patrick H. Madden
2013
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IEEE design & test
doi:10.1109/mdt.2012.2230391
From the EIC: Circuits and Systems for VLSI IoT Devices
Jorg Henkel
2019
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IEEE design & test
doi:10.1109/mdat.2019.2924097
Enabling Automated Bug Detection for IP-based Designs using High-Level Synthesis
Pietro Fezzardi, Christian Pilato, Fabrizio Ferrandi
2018
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IEEE design & test
doi:10.1109/mdat.2018.2824121